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0000058071 00000 n High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. Advantest. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. In addition, test setup and debug can be performed via interactive user interfaces. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. TSE: 6857. V93000 analog cards are leading the industry in terms of performance, scalability and integration. 0000085770 00000 n Verigy V93000 Pin Scale 1600 VelocityCAE. 0000033254 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000029728 00000 n 0000058694 00000 n View and Download Advantest instruction manual online. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. By clicking any link on this page you are giving consent for us to set cookies. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. E-mail Kantor : spiuho@uho.ac.id The information in the materials on this Web site speaks as of the date issued. %PDF-1.4 % Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. V93000 Visionary and Enduring Architecture. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. 0000012048 00000 n More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. 0000062394 00000 n Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Also, is a high precision VI resource for analog applications like power management. TSE: 6857. 0000003026 00000 n All Rights Reserved. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. 0000011255 00000 n Click on more information for further details. 0000059227 00000 n Floating VI Source for High Power Applications. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. It improves throughput while maintaining compatibility with the established MBAV8 instrument. 0000180605 00000 n The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. 0000013084 00000 n Implementing the demodulation for the ever growing number of standards is very time consuming. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? The more that could be run in parallel, the greater the test time savings. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Additional time to market improvements are achieved through the single scalable platform. 0000012694 00000 n 0000058780 00000 n HLUPTG}@;O 0000017226 00000 n E-mail Admin : saprjo@yahoo.com. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. 0000018400 00000 n The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream DC testing Shmoo tools, data logging, and histograms. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. 0000061569 00000 n Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. 0000059091 00000 n Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. 0000015761 00000 n Advantest Corporation V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. All features and performance points are available in all classes. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure T2000. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. 810~11. Advantest Corporation The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. 0000059144 00000 n Each channel can provide up to 80V and 10 amps. (Cut outs impact deflection/rigidity properties). Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. Release 5.4.3. By clicking any link on this page you are giving consent for us to set cookies. User-specific tests are programmed with test methods in C. Links are . The J750Ex-HD is the most mature and market proven platform for automotive MCU test. This paragraph applies only to the extent permitted by applicable law. . Automation Solutions Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. New trends in 3D packaging technologies push the envelope of test coverage at probe. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. TSE: 6857. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. Smart Test, Smart ATE, Smart Scale. Training needs are limited due to a single, familiar test system.
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